16th International Exhibition of Testing and Measuring Equipment Testing & Control
22–24 October 2019 • Moscow, Crocus Expo

New XP7 pellet scanner from Optical Control Systems GmbH

News
 

The company Analytics and Devices, the official representative of Optical Control Systems GmbH, is announcing a new XP7 pellet scanner for detecting metal impurities with a capacity of up to 600 kg / h.

Innovative x-ray technology continuously records the image of the flow of granules and detects metallic inclusions with a resolution of 50 microns.

Contaminated granules are sorted using a multi-track system with air nozzles.

The device is equipped with all necessary protective devices and meets all safety requirements in accordance with DIN 54113.

The supplier - Analytics and Instruments LLC  is a participant of  the Testing and Control 2019 exhibition.

You can get more detailed information from the specialists of Analytics and Instruments LLC at stand No. E 421 in pavilion 1/3 of Crocus Expo IEC from  October  22 to 24, 2019.

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