11 September 2019 News The company Analytics and Devices, the official representative of Optical Control Systems GmbH, is announcing a new XP7 pellet scanner for detecting metal impurities with a capacity of up to 600 kg / h. Innovative x-ray technology continuously records the image of the flow of granules and detects metallic inclusions with a resolution of 50 microns. Contaminated granules are sorted using a multi-track system with air nozzles. The device is equipped with all necessary protective devices and meets all safety requirements in accordance with DIN 54113. The supplier - Analytics and Instruments LLC is a participant of the Testing and Control 2019 exhibition. You can get more detailed information from the specialists of Analytics and Instruments LLC at stand No. E 421 in pavilion 1/3 of Crocus Expo IEC from October 22 to 24, 2019.