Synercon to Showcase Its Developments at the Testing&Control Exhibition

Synercon is pleased to announce the expansion of its product line. In response to the growing interest in high-precision elemental and structural analysis, two additional classes of analytical equipment will be presented at the Synercon booth:

• X-ray diffractometers — designed for phase composition determination, identification of crystalline substances, and quality control of materials at the microstructural level.

• Optical emission spectrometers with inductively coupled plasma (ICP-OES) — for fast and accurate elemental analysis ranging from ppb to percent levels in samples of various origins, from food products to metallurgical alloys.

Thanks to these technologies, Synercon's customers gain access to a wider range of analytical capabilities. The new solutions will enable laboratories to achieve a fundamentally new level of quality control.

Visitors will have the opportunity to explore the equipment on display, consult with specialists, and discuss technical challenges at booth F311.